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Products » Testing Accessories » Specimen Measuring and Preparation » Specimen Measurement Devices » Vertically Mounted Probe

Vertically Mounted Probe Automatic Measurement System

Specimen Measuring and Preparation Tools

  • Specimen Measurement Devices
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2850-003
  • 2850-003
  • Description
  • Specifications
  • Literature

2850-003 | Vertically Mounted Probe Measurement System

Includes vertically mounted gage probe with indicator, stand, tip set, footswitch, USB interface, and connecting cables.

Range: 0 - 25 mm (0 - 1.0 in)

Resolution: 0.001 mm (0.00005 in)

Scale Range Vertically Mounted Probe Automatic Measurement System
Resolution 0 - 25 microns (0 - 1 microinches)

Specimen Measurement Devices

Instron® testing systems provide an accurate measurement of force during a test, but in order to produce accurate stress results, you must measure the specimen and get the dimensional data into Bluehill® Universal Software. While digital instruments, such as micrometers, can provide accurate measurements, using them properly takes time and requires the operator to manually enter the dimensional data into the software.

  • Products
  • 12/11/2017
  • 0.6 MB

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